The focused ion beam instrument is a tool used to look at the surface of superconducting qubit devices and prepare thin lamellas of specific regions of the device for transmission electron microscopy analysis. Photo: Ryan Postel, Fermilab
December 14, 2021
The focused ion beam instrument is a tool used to look at the surface of superconducting qubit devices and prepare thin lamellas of specific regions of the device for transmission electron microscopy analysis. Photo: Ryan Postel, Fermilab